![]() The probe can be configured with Ground-Signal-Ground (G,S,G), Custom mounts are available as well.Īny pitch (tip spacing) from 25 to 2540 microns may be specified. Standard microwave probe stations or attached to thin bladesįor use with dc probe needles on a probe card or multi-contact The Model 40A can be mounted in various adaptors for use with The Model 40A microwave probe also provides direct viewing of This reliable low resistanceĬontact is one of the keys to providing highly repeatable measurements. ![]() Tungsten, or Nickel tips, the Model 40A provides reliable contacts, even With its individually spring loaded, Beryllium-Copper, Insertion loss of less than 0.8 db and a return loss of greater Using low loss coaxial techniques, the Model 40A achieves an Microwave probe sets new standards in microwave probing performance. High Performance Microwave Probes Model 40A Features A flex strip may alternatively be disposed behind a substrate with probes.Picoprobe Model 40A High Performance Microwave RF Probe The flex cable provides relatively high bandwidth signal paths linking the tester to probes accessing others of the IC's pads. The probe board assembly includes one or more rigid substrate layers with traces and vias formed on or within the substrate layers providing relatively low bandwidth signal paths linking the tester to probes accessing some of the IC's pads. of probe tipsĪ probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of IC's to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the ICs I/O pads. G01R3/00- Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g.testing of parts without further processing to modify the parts as such Structural arrangements therefor H01L22/00- Testing or measuring during manufacture or treatment Reliability measurements, i.e.H01L- SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR.bed of nails or probe with bump contacts on a rigid support bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. G01R1/07314- Multiple probes with individual probe elements, e.g. ![]()
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